Materials Research Laboratory
CMM- Staff
The CMM houses a suite of state-of-the-art instrumentation focussing on the micro- and nanocharacterization of materials using electron-beam, ion-beam, x-ray, and laser techniques. The CMM operates under the guidelines of the FSMRL Central Facilities philosophy that modern instrumentation for nanocharacterization of materials is most effectively utilized in a shared mode, supported by skilled professionals.
CMM Capabilities List
- Accelerator-based Techniques for Analysis
- Optical Spectroscopy and Ellipsometry
- Optical and Near-field Microscopy
- Scanning Electron Microscopy (SEM) and Focussed Ion Beam (FIB)
- Scanning Probe Microscopy (SPM)
- Surface Analysis
- Transmission and Scanning Transmission Electron Microscopy (TEM) and (STEM)
- X-ray Diffraction and Reflectivity (XRD) and (XRR)
General Numbers
Professor Ivan Petrov- Director
(217) 333-8396
(217) 244-2278 fax
petrov@uiuc.edu
Ramona Simpson - Administrative secretary: (217) 333-1371
Accelerator Techniques: (217) 333-1383
Electron Microscopy: (217) 333-3888
Surface Analysis: (217) 333-0386
X-Ray Diffraction: (217) 333-1612
Staff Directory:
B70 MRL |
(217) 333-1383 |
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Scanning Electron Microscopy (SEM) and Focussed Ion Beam (FIB) |
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372/0020 MRL |
(217) 333-4265 |
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444 MRL |
(217) 265-5380 |
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0018 MRL |
(217) 244-4520 |
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368/0014 MRL |
(217) 244-2969 |
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0018 MRL |
(217) 244-4520 |
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214/0016 MRL |
(217) 244-2973 |
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302/B81/B06/B08 MRL |
(217) 244-2974 |
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374/0016 MRL |
(217) 244-2964 |
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344/B01/B04 MRL |
(217) 244-0298 |
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Transmission and Scanning Transmission Electron Microscopy (TEM) and (STEM) |
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214/B67 MRL |
(217) 244-6177 |
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372/0020 MRL |
(217) 333-4265 |
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444/B67 MRL |
(217) 265-5380 |
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306 MRL |
(217) 244-9499 |
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301/B67 MRL |
(217) 333-1413 |
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370 MRL |
(217) 333-1612 |